X-ray testing, biometrics, machine vision, computer vision, image processing, pattern recognition, food engineering.
Domingo Mery is the Associate Dean for Research and Innovation of the School of Engineering at the Catholic University of Chile (UC). He is Professor in the Department of Computer Science at UC. He received the Diploma (M.Sc.) degree in Electrical Engineering from the Technical University of Karlsruhe, Germany, in 1992, and the Ph.D. degree with distinction at the Technical University of Berlin, in 2000. He was a Research Scientist at the Institute for Measurement and Automation Technology at the Technical University of Berlin with the collaboration of YXLON X-Ray International. He was a recipient of a Scholarship from the Konrad-Adenauer-Foundation, and from a Scholarship from the German Academic Exchange Service (DAAD) for his Ph.D. work. He was Associate Research in 2001 at the Department of Computer Engineering at the University of Santiago, Chile. Now, he is Full Professor at the Department of Computer Science at the Pontificia Universidad Católica de Chile (UC), Chile. He was Chair of the Computer Science Department in 2005-2009. He was Associate Visiting Professor at the Computer Vision Researh Lab of the University of Notre Dame in 2014-2015. He is Director of Research and Innovation of the School of Engineering at the UC. He serves as Associate Editor of IEEE Transactions on Information, Forensics and Security and the International Journal of Fuzzy Logic and Intelligent Systems. In addition, he is the Editor of I3 Journal for Research, Interdiscipline and Innovation at the School of Engineering (UC). His research interests include image processing for fault detection in aluminum castings, X-ray imaging, real-time programming and computer vision. He is author of more than 60 technical SCI publications, and more than 70 conference papers. He served as Local Co-chair ofICCV2015 (Santiago de Chile). He was program general chair of te PSIVT2007 and 2007 Iberoamerican Congress on Pattern Recognition.
Ron Halmshaw Award for best 017 on industrial radiography in journal Insight.IAPR Best Paper Presentation at PSIVT2015, Auckland.
Best Paper Award, International Workshop on Soft-Biometrics in conjunction with ECCV14, Zürich.
John Grimwade Medal for publishing the best paper during 2013 in journal Insight.
Ron Halmshaw Award for publishing the best paper during 2012 on industrial radiography in journal Insight.
Ron Halmshaw Award for publishing the best paper during 2005 on industrial radiography in journal Insight.
